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Sankore

Named after the University of Sankore in Timbuktu — one of the world’s oldest centres of learning. Every figure here is computed from work-level records in our own graph, never copied from a source’s summary count.

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Thermal and noise-induced reliability degradation in 3-D CNTFET-based neuromorphic circuits: simulation and analysis using Nano-HUB and MATLAB

2025Dutse Journal of Pure and Applied SciencesJournalOpen access

10.4314/dujopas.v11i3a.28 Full text0 citations

Authors

6 authors across 3 institutions in 2 countries.

Abdullahi Bappah AhmedFirst author
- Gombe State University (NG)
- Maitama Sule University Kano (NG)
Abdullahi Bappah AhmedFirst author
- Gombe State University (NG)
- Maitama Sule University Kano (NG)
Hamza M Umar
- Maitama Sule University Kano (NG)
Mansur Said
as printed: Mansur Sa’id
Ismail A. Mahmoud
- Maitama Sule University Kano (NG)
as printed: Ismail A Mahmoud
Zakiyyu I TakaiSenior author

Fields

Assignment is probabilistic — a work belongs to several fields in proportions.

Advanced Memory and Neural Computinglevel 3 · 0.55
Ferroelectric and Negative Capacitance Deviceslevel 3 · 0.06
Advancements in Semiconductor Devices and Circuit Designlevel 3 · 0.05

Sources

Several sources describing one work is the point — it means the record rests on more than one authority.

openalexseen September 9, 2026
2025 · Dutse Journal of Pure and Applied Sciences · 0 citations
https://openalex.org/W4415794898

Thermal and noise-induced reliability degradation in 3-D CNTFET-based neuromorphic circuits: simulation and analysis using Nano-HUB and MATLAB · Sankore