Influence of power and duration on RF sputtering for the formation of terbium oxide passivation layers via the argon ambient
2024Journal of Materials Science Materials in ElectronicsJournal
10.1007/s10854-024-12717-yFull text3 citations
2024Journal of Materials Science Materials in ElectronicsJournal
10.1007/s10854-024-12717-yFull text3 citations
7 authors across 4 institutions in 3 countries.
Assignment is probabilistic — a work belongs to several fields in proportions.
Several sources describing one work is the point — it means the record rests on more than one authority.
2024 · Journal of Materials Science Materials in Electronics · 3 citations
https://openalex.org/W4396834096