Effects of Oxidation Duration on the Structural and Electrical Characteristics of Ho2O3 Gate Oxide on 4H-SiC Substrate
2022Journal of Electronic MaterialsJournal
10.1007/s11664-022-09686-5Full text4 citations
2022Journal of Electronic MaterialsJournal
10.1007/s11664-022-09686-5Full text4 citations
4 authors across 2 institutions in 2 countries.
Assignment is probabilistic — a work belongs to several fields in proportions.
Several sources describing one work is the point — it means the record rests on more than one authority.
2022 · Journal of Electronic Materials · 4 citations
https://openalex.org/W4281252575